Skip to main content
Home
  • Home
  • About UCIMRI
    • Director's Message
    • Executive Committee
    • Faculty Advisory Committee
    • Directory
    • Map and Direction
    • Facilities
      • Center for Transmission Electron Microscopy (CTEM)
        • JEM-ARM300F Grand ARM TEM
        • Nion200 STEM
        • JEOL 2800 TEM
        • JEOL JEM-2100F TEM
        • Tescan GAIA3 SEM-FIB
        • Fischione Nanomill
        • Gatan Dimple Grinder II -model 657
        • Gatan PIPSII ion mill
        • Gatan Solarus Advanced Plasma Cleaning System
        • MultiPrep™ Polishing System
      • Laboratory for Electron and X-ray Instrumentation (LEXI)
        • FEI Magellan 400 XHR SEM
        • FEI Quanta 3D FEG Dual Beam (SEM/FIB)
        • Rigaku SmartLab X-ray Diffractometer
        • Rigaku Ultima-III
        • Angstrom Engineering EvoVac Glovebox Evaporator
        • Nano CT
        • PNI Nano-R AFM
        • Polytec MSA-500 Micro System Analyzer ( vibrometer)
      • Materials Characterization Center (MC2)
        • Anton Paar AFM
        • FEI XL-30 FEGSEM
        • FEI-Philips CM20 TEM
        • Hitachi Regulus 8230 ultra high resolution SEM
        • Siemens D5000 XRD
      • Surface Science Facility (SSF)
        • AXIS Supra by Kratos Analytical
      • TEMPR (thermal, elemental, mechanical, physical and rheological) facility
        • Instron 3300 Dual Column Universal Testing System
        • Micromeretics Pycnometer
        • Micromeritics Surface Characterization Analyzer
        • Netzsch Libra TGA
        • Netzsch Polyma DSC
        • Netzsch Simultaneous Thermal Analyzer (STA)
        • TA Instruments DSC 2500 Differential Scanning Calorimeter
        • TA Instruments Hybrid Rheometer
        • TA Instruments Q500 Thermal Gravimetric Analyzer
        • TA Instruments Q800 Dynamic Mechanical Analyzer
        • Thermo FlashSmart combustion and pyrolysis analyzer
        • ThermoiCAPRQ C2 ICP-MS system
        • Wyatt / Waters Gel Permeation Chromatography w/ Multi-angle Light Scattering
    • IMRI Facilities in general
    • Contact Us
      • General Contact Info
      • Visiting & Tours
    • IMRI Management Structure
    • Job Opportunities
    • IMRI Brochures
      • Brochure A
      • Brochure B
  • User Facilities
    • IMRI Instruments
      • Transmission Electron Microscopes (TEM)
        • Nion200 STEM
        • JEM-ARM300F Grand ARM TEM
        • JEOL 2800 TEM
        • JEOL JEM-2100F
        • FEI-Philips CM20 TEM
      • Scanning Electron Microscope-Focus Ion Beam systems (SEM-FIB)
        • Tescan GAIA3 SEM-FIB
        • FEI Magellan 400 XHR SEM
        • FEI Quanta 3D FEG Dual Beam (SEM/FIB)
        • Hitachi Regulus 8230 ultra high resolution SEM
        • FEI XL-30 FEGSEM
      • X-ray Diffractometers (XRDs)
        • Rigaku SmartLab X-ray Diffractometer
        • Rigaku Ultima-III
        • Siemens D5000 XRD
      • Surface Analysis
        • AXIS Supra by Kratos Analytical
      • 3-Dimensional Imaging and Analysis
        • Polytec MSA-500 Micro System Analyzer ( vibrometer)
        • Anton Paar AFM
        • Nano CT
        • PNI Nano-R AFM
      • Thermal, Elemental, Mechanical, Physical and Rheological properties
        • Netzsch Libra TGA
        • Netzsch Polyma DSC
        • Instron 3300 Dual Column Universal Testing System
        • Micromeretics Pycnometer
        • Micromeritics Surface Characterization Analyzer
        • TA Instruments DSC 2500 Differential Scanning Calorimeter
        • TA Instruments Hybrid Rheometer
        • TA Instruments Q500 Thermal Gravimetric Analyzer
        • TA Instruments Q800 Dynamic Mechanical Analyzer
        • Thermo FlashSmart combustion and pyrolysis analyzer
        • ThermoiCAPRQ C2 ICP-MS system
        • Wyatt / Waters Gel Permeation Chromatography w/ Multi-angle Light Scattering
        • Netzsch Simultaneous Thermal Analyzer (STA)
      • Specimen Preparation Instruments
        • Gatan PIPSII ion mill
        • Fischione Nanomill
        • Gatan Dimple Grinder II
        • Gatan Solarus Advanced Plasma Cleaning System
        • MultiPrep™ Polishing System
    • Instrument Status and Rules
  • For Users
    • IMRI Facility Management System
    • Become a User
      • UC Irvine
        • Registration for UCI users
      • UC
        • Registration for UC users
      • External-academic
        • Registration for users from non-UC educational organizations
      • External-commerial
        • Registration for users from companies
    • Training Waiting lists
    • Reservation Systems
      • Angstrom_Evaporator
      • Calit2_AFM
      • FEI CM-20 TEM
      • FEI Magellan 400 SEM
      • FEI Quanta 3D SEM/FIB
      • Kratos AXIS-SUPRA
      • Nano_CT
      • Rigaku SmartLab
      • Rigaku Ultima III
      • TEM2800
      • Tescan_SEM_FIB
      • Vibrometer
      • XL-30 SEM
    • Billing and Rates
    • Facility Policy
      • Acknowledgement policy
      • Billing and Rates Policy
      • External user (except UC compuses) agreement
      • Facility visitor policies
      • Instrument usage policy
      • Key- Keycard application
      • Safety policy
      • Training policy
      • Collaboration policy
    • Facility Blog
    • Safety
    • Instrument Status and Rules
    • Instrument Status (full screen)
    • Publications
    • Gallery
  • For Industry
    • Intellectual Property
    • Service and Project
  • Research
    • People
    • Novel Techniques
    • Highlights
      • Probing the dynamics of nanoparticle formation from a precursor at atomic resolution
    • Companies
    • Publications
    • Research Results
    • UCI Research Ecosystem
  • Education
    • Courses
      • IMRI summer lecture-2016
      • UC Mesoscale Materials Summer School
    • Outreach
    • Tutorial
  • News & Events
    • News
      • UCI scientists develop method for observing nanocrystal formation at atomic resolution
      • Grand Opening of UC Irvine Materials Research Institute (IMRI) 
      • Nature Materials News & Views Published: 14 October 2019
      • Nature Materials, Oct 14, 2019: doi:10.1038/s41563-019-0485-2
      • UCI Scientists Create New Class of Two-dimensional Materials
    • Research Highlights
      • Nature Nanotechnologyvolume 13, pages1132–1136 (2018)
    • Announcements
      • Facilities Highlights
      • Job opportunities
        • Project Scientist Series-IMRI-new opening
        • Assistant Professor in Cryo-Electron Microscopy
        • Faculty Position in Materials Science and Transmission Electron Microscopy
        • Faculty Position in Transmission Electron Microscopy
    • Seminars and Events
      • liquid phase electron microscopy
      • IMRI Special Seminar: The value of In Situ TEM
      • IMRI special seminar:Molecular Design for Reliable Organic Electronics
      • Imaging Materials Properties at the Nanoscale
      • IMRI Special Seminar: Exploiting Functional Materials
      • IMRI special seminar: Development and Characterization of Synthetic Polymers for Medical Applications
  • IMRI Facility Management System
  • Become a User
  • Training Waiting lists
  • Reservation Systems
    • Angstrom_Evaporator
    • Calit2_AFM
    • FEI CM-20 TEM
    • FEI Magellan 400 SEM
    • FEI Quanta 3D SEM/FIB
    • Kratos AXIS-SUPRA
    • Nano_CT
    • Rigaku SmartLab
    • Rigaku Ultima III
    • TEM2800
    • Tescan_SEM_FIB
    • Vibrometer
    • XL-30 SEM
  • Billing and Rates
  • Facility Policy
  • Facility Blog
  • Safety
  • Instrument Status and Rules
  • Instrument Status (full screen)
  • Publications
  • Gallery

You are here

Home » For Users » Reservation Systems

Kratos AXIS-SUPRA

© 2001-2010 The Regents of the University of California. All rights reserved. Copyright & Legal Notices.


This Web site is the responsibility of webmaster@ps.uci.edu.
If any of the material is in violation of a copyright, please contact the e-mail address.
Links on these pages to commercial Web sites do not represent endorsement by the University of California or its affliates.

User login

  • Log in using UCInetID
  • Request new password