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Toshihiro Aoki, PhD

Project Scientist in TEM, Irvine Materials Research Institute (IMRI)

978-979-7306

toshihia@uci.edu

Office: 1150 Engineering Hall

Toshihiro “Toshi” Aoki is a materials scientist and electron microscopist specializing in nano-materials characterization using conventional and aberration-corrected S/TEM with EELS and EDS. He has authored and co-authored over 60 peer-reviewed articles in journals such as Nature, Nature Communications, Energy & Environmental Science, Nano Letters, Advanced Materials, Physical Review Letters, Advanced Science, Chemistry of Materials, and many more. Educated at Arizona State University (ASU) on conventional high-resolution electron microscopy (HREM) and materials science, and then joined JEOL USA Inc. to learn more about instrumentation on aberration corrected S/TEM, Toshi developed a deep understanding on electron optics and applications of conventional and aberration corrected S/TEM to nano-structured materials science.

He received Young Scientist Award from Japan Institute of Metals (1998), Outstanding Student Paper in the 2002 Workshop on the Physics and Chemistry of II-VI Materials (2002) and contributed to MSA Poster award 1st place (2005), and Poster award 1st place in EDGE 2013 Meeting (2013).  Also he has been serving as a proposal reviewer for Center for Functional Nanomaterials at Brookhaven National Laboratory since 2013. 

Prior to joining UCI, he was a research engineer at John M. Cowley Center for High Resolution Electron Microscopy in ASU, and previously served as senior applications specialist for JEOL USA, Inc, visiting scientist for Lehigh University, and postdoc for Professor David J. Smith at ASU.