- Home
- About IMRI
- User Facilities
- Introduction to IMRI facilities
- Center for Transmission Electron Microscopy (CTEM)
- Laboratory for Electron and X-ray Instrumentation (LEXI)
- Surface Science Facility (SSF)
- TEMPR (thermal, elemental, mechanical, physical and rheological) facility
- Netzsch Simultaneous Thermal Analyzer (STA)
- Netzsch Libra TGA
- Netzsch Polyma DSC
- Instron 3300 Dual Column Universal Testing System
- Micromeretics Pycnometer
- Micromeritics Surface Characterization Analyzer
- TA Instruments DSC 2500 Differential Scanning Calorimeter
- TA Instruments Hybrid Rheometer
- TA Instruments Q500 Thermal Gravimetric Analyzer
- TA Instruments Q800 Dynamic Mechanical Analyzer
- Thermo FlashSmart combustion and pyrolysis analyzer
- ThermoiCAPRQ C2 ICP-MS system
- Wyatt / Waters Gel Permeation Chromatography w/ Multi-angle Light Scattering
- Materials Characterization Center (MC2)
- IMRI TEMs ( transmission electron microscopes)
- IMRI SEM-FIB ( scanning electron microscope-focus ion beam systems)
- IMRI XRDs (X-ray Diffractometers)
- Instrument Status and Rules
- Instrument Status (full screen)
- For Users
- For Industry
- Research
- Education
- News & Events
- News
- Research Highlights
- Announcements
- Seminars and Events
- liquid phase electron microscopy
- IMRI Special Seminar: The value of In Situ TEM
- IMRI special seminar:Molecular Design for Reliable Organic Electronics
- Imaging Materials Properties at the Nanoscale
- IMRI Special Seminar: Exploiting Functional Materials
- IMRI special seminar: Development and Characterization of Synthetic Polymers for Medical Applications
You are here
FEI Magellan 400 XHR SEM
FEI Magellan 400 SEM
The FEI Magellan 400 SEM is an extreme high resolution scanning electron microscope equipped with a new monochromated electron column. This SEM enables sub-nanometer resolution and high surface sensitivity at low landing energies, and is capable of light element analysis, fast elemental mapping, electron beam lithography and low voltage (15-30kV) STEM.
Electron Source & Operating HT: Field emission gun 1kV~30kV
Resolution:
• Resolution @ optimum WD
–– 0.8 nm at 15 kV
–– 0.8 nm at 2 kV
–– 0.9 nm at 1 kV
–– 1.5 nm at 200 V
• Resolution @ coincident point
–– 0.8 nm at 15 kV
–– 0.9 nm at 5 kV
–– 1.2 nm at 1 kV
Operation mode:
- SEM
- STEM (ADF, BF)
Detectors and Attachments:
- Everhart-Thornley Detector
- Through-the-lens detector (TLD)
- Concentric backscatter electron (CBS) detector
- Scanning transmission electron microscopy (STEM) detector
- EDS: Oxford silicon drift detector (80 mm2) and both INCA and AZtec software
- Nabity NPGS (nanometer pattern generation system)