JEM-2800 Transmission Electron Microscope

High Throughput, Automated TEM, S/TEM, SEM and Analysis

The JEOL-2800 is a high throughput nano-analysis field emission TEM with automated functions.  This versatile microscope features various imaging mode such as TEM (including nanobeam and CBED mode), STEM (ADF, BF), and SEM. It is also equipped with dual large angle SDD EDS, making rapid EDS mapping possible.

Electron Source & Operating HT: Schottky type field emission gun/100kV and 200kV

Resolution:
TEM Point-to-point: 0.24nm
STEM HAADF: 0.19nm
SEM: 1.0nm

Operation mode:
TEM (including nano-beam and convergent beam modes)
STEM (ADF, BF)
SEM

EDS: Dual silicon drift detectors

CCD camera: Gatan OneView Camera: fast 25fps with full 4K x 4K resolution