Xradia VersaXRM™ 410 was moved to INRF

Under the support of NSF and UCI, a state-of-the-art nano-CT system from Xradia has been purchased and installed in 1301 Calit2 Building.

This Xradia VersaXRM™ 410 is the latest generation of three-dimensional (3-D) X-ray microscopy (XRM) solutions optimized for non-destructive micro tomography for heterogeneous materials.

The VersaXRM 410 advances industry and science with a versatile combination of world-leading resolution and contrast, sample flexibility and the large working distance required to address emerging research challenges.

The system's source technology and high resolution detector provide unmatched sub-micron resolution (800nm), even for large samples.

Applications include semiconductor process optimization and failure analysis, virtual core analysis for oil and gas exploration, stained and unstained hard and soft tissue studies, crack propagation and porosity studies, and in situ measurements and time-dependent (4D) studies.

If you need to receive training or get access to this instrument, please contact Dr. Lizhi Sun or Mr. Dongxu Liu directly.   

One data processing software, Simpleware, is avaialble for users. Please contact Dr. Jian-Guo Zheng if you need to use the software. Please sign up in the on-line form.