Surface Analysis – Instruments

AXIS Supra

AXIS Supra by Kratos Analytical

Nickname: SupraStatus: Operational

The Kratos AXIS-Supra is a UHV high-performance multi-technique instrument allowing materials study and investigation using a broad combination of surface-sensitive spectroscopic and microscopic characterization methods: high-sensitivity X-ray photoelectron spectroscopy and microscopy (XPS and XPS imaging), high-resolution scanning field emission Auger spectroscopy and microscopy (SEM, SAM, AES), ultraviolet photoelectron spectroscopy (UPS), ion scattering spectroscopy (ISS) and reflection electron energy loss spectroscopy (REELS). Learn More…

Vibrometer

Polytec MSA-500 Micro System Analyzer (Vibrometer)

Nickname: VibrometerStatus: Operational

The Polytec Micro System Analyzer (MSA-500) is used for ambient non-contact and non-destructive measurement of three-dimensional movements in microsystems and devices. The out-of-plane movement is measured using the Polytec Microscope Scanning Vibrometer (PSV), in-plane movement with the Planar Motion Analyzer (PMA), and 3D topography measurements can also be made with the Topography Measurement System (TMS) to acquire the surface geometry of rough and also reflective structures. Learn More…

Anton Paar

Anton Paar AFM

Nickname: AFMStatus: Operational

Tosca 400 AFM is a compact system with a large sample stage that enables users to detect surface topography down to atomic steps. This AFM provides basic surface imaging in both contact tapping mode and contact mode and force-distance measurement. Learn More…