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1121-1151 Engineering Hall
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JEOL JEM-2200F TEM
Description
JEM-2200F is an advanced field emission 200kV TEM equipped with the in-column Omega energy filter that allows zero-loss imaging, enhancing image contrast by filtering the inelastic electrons out from image formation. Its imaging system, consisting of four-stage intermediate lenses and two-stage projector lenses, offers rotation-free TEM images and diffraction-patterns over a wide range of magnifications and camera lengths.
Compatible Holders:
JEOL single tilt holder
JEOL double tilt holder
Gatan 914 single tilt Cryo-transfer holder
JEM-2200 is equipped with a TVIPS-F416 camera that carries 4k x 4k CMOS sensors covering a large physical area of 63.5 x 63.5 mm2 (16 microns per pixel).
Instrument Features
- Schottky-type field emission electron source with 80~200 kV TEM operation
- Cryo-pole piece and cryo-cup ensure stable and low ice contamination in cryo-EM
- In-column type energy filter, Omega filter, which enables zero-loss imaging, enhancing the contrast of especially biological specimens
- Conventional diffraction contrast imaging (BF and DF)
- High-resolution electron microscopy (HREM)
- Selected area diffraction (SAD), convergent beam electron diffraction (CBED), and nanobeam electron diffraction (NBED) are available
Popular Applications
- Cryo-EM of biological specimens
Instrument Specifications
Electron Source: Schottky-type field emission gun
Operating HT: 100 kV and 200 kV
Operation mode: TEM (nano-beam and convergent beam modes)
TEM Point to point resolution: 0.27 nm (200 kV)
Lattice resolution: 0.1 nm (200 kV)