JEM-2800 is an advanced analytical and high-throughput 200 kV S/TEM with a Schottky-type field emission electron source. This multi-purpose workhorse S/TEM employs an easy-to-use and highly stable operating system for high-resolution imaging in TEM (including the nanobeam and convergent beam modes), STEM (available detectors, ADF, BF, and SEI). JEM-2800 is also equipped with dual 100mm2 Silicon Drift Detectors (SDD) that offer the ultimate sensitive and rapid X-ray analysis (EDS). Also, the microscope recently added the NanoMegas precession electron diffraction system, which makes both strain and orientation mapping possible.

JEM-2800 is equipped with a Gatan Oneview camera that allows data capture at imaging or in-situ mode (Video capture). The 4k x 4k image gives a high dynamic range (more than 16 bits) and employs real-time drift correction to ensure optimal quality. The flexible resolution/frame rate offers multiple options of temporal resolutions, from 4k x 4k at 25 frames per second up to 512 x 512 at 300 frames per second, and always at 100% duty cycles.

• High throughput S/TEM either at 200 kV or 100 kV using HAADF, BF, and SEI detectors
• Conventional diffraction contrast imaging (BF and DF)
• High-resolution electron microscopy (HREM)
• Selected area diffraction (SAD) convergent beam electron diffraction (CBED) and nanobeam electron diffraction (NBED)
• Dual 100mm2 SDD detectors for rapid EDS mapping
• Gatan OneView camera with IS mode, which enables video recording with high frame rates (4 k x 4 k at 25fps, 512 x 512 at 300 fps)
• Biasing, heating, cooling, and liquid cell holders are available
• NanoMegas’s precession electron diffraction system

• Conventional TEM and HREM imaging
• STEM HAADF, BF, and SEI imaging
• Rapid EDS elemental mapping
• In-situ experiment using heating, liquid cell, and biasing holders
• Strain and orientation mapping using Precession electron diffraction

 Electron Source: Schottky-type field emission gun
Operating HT: 100 kV and 200 kV
Operation mode: TEM (nano-beam and convergent beam modes), STEM (ADF, BF), SEM
TEM Point-to-point resolution: 0.21 nm
SEM resolution: 1.0 nm
Lattice resolution: 0.1 nm (both 200 kV and 100 kV)
STEM HAADF resolution: 0.163 nm (200 kV) and 0.193 nm (100 kV)
STEM SEI resolution: 0.5 nm (200 kV) and 1.0 nm (100 kV)
EDS energy resolution: 120 eV