Nion UltraSTEM HERMES200 is the first of its kind in the USA. This highly-sophisticated scanning transmission electron microscope, equipped with a high-brightness cold field emission gun, high-energy-resolution monochromator, third-generation C3/C5 aberration corrector, and Nion EELS spectrometer, provides world-leading capabilities in materials characterization at the atomic scale and offers high-level capabilities for probing materials structure, chemistry, and properties. The Nion’s high brightness/high stability cold field emission gun features several new design elements that allow operation from lower voltages (30 kV) up to 200 kV with unrivaled performance. Thanks to this flexible and stable gun, researchers can conduct gentle STEM on beam-sensitive materials at low voltages and up to 200 kV to study more robust materials with the ultimate resolution of 0.6 Å. The unique capabilities of the Nion UltraSTEM HERMES200 are the monochromator and new Nion Iris spectrometer, which demonstrate 5.7 meV energy resolution at 60 kV and 4.2 meV at 30 kV. This supreme energy resolution allows researchers to conduct vibrational/ phonon spectroscopy as well as valence EELS.

The Nion UltraSTEM HERMES200 enables researchers to explore the atomic structure, chemical bonding, local electronic structure, and vibrational properties of materials with the highest spatial resolution in combination with ultrahigh energy resolution.

Spatial resolution: 0.6 Å (200 kV), 0.9 Å (100 kV), 1.1 Å (60 kV) 1.2 Å in high-angle dark-field imaging mode (HAADF)
Energy resolution: 4.2 meV (30 kV) 5.7 meV (60 kV), 9.2 meV(100 kV), and 16 meV (200 kV)
Probe current: > 1 nA in a 2 Å probe
Sample stage stability: <a few nm/h