Rigaku SmartLab X-ray Diffractometer
| Location | 1302 Calit2 Building |
| Contact: | Dr. Qiyin Lin |
| Email: | qiyinl@uci.edu |
| EMERGENCY: | 9-1-1 |
| UCI Police: | (949) 824-5223 |
| UCI Medical Center: | (714) 456-6123 |
| Usage ($) | Training ($) | |
| UC Campuses |
10 | 40.00 |
| Other Academic |
13 | 52.00 |
| Industrial |
30 | 120.00 |
NOTE: Same rates for On-Peak and Off-Peak hours. Typical training time: 5 Hours. Training is billed per hour per person. Usage is billed per hour.
| Keycard Access: | Daytime or 24/7 |
| Instrument Access: | Daytime or 24/7 |
NOTE: Keycard access is required at all times to enter the TEM Labs. Users who have yet trained are not permitted to operate any lab instruments. Users who wish to bring guests are required to notify the Lab Manager in advance.
Description
The Rigaku SmartLab can provide parafocusing geometry for powder samples and parallel beam geometry for thin films and epilayers. The system incorporates SAXS optics for measuring structures with d-spacings up to 100 nm in either transmission (spinning capillary) or reflection (GISAXS) mode. An in-plane diffraction attachment provides an additional detector scanning axis orthogonal to the theta/2-theta diffraction plane to allow the measurement of lattice planes perpendicular to the sample surface (e.g., in-plane reciprocal space maps and full pole figures).
Measurement packages are available for nearly any conceivable X-ray scattering experiment, including the following:
- Powder materials: phase ID, crystalline strain and size, crystallinity, structural analysis and refinement, stress measurement, temperature-dependent in situ phase evolution to 1400°C in a controlled or ambient environment
- Thin films: Structural analysis, texture analysis, inplane diffraction, crystal quality analysis (rocking curve and reciprocal space mapping), high-resolution X-ray diffraction, GIXRD depth profiles, 2D stress, and PF measurement, temperature-dependent in situ phase evolution up to 1000°C in a controlled or ambient environment
- High-resolution X-ray reflectivity (HRXRR): polycrystalline, single crystal or amorphous thin film layer thickness, surface and interface roughness, density or composition.
- Small-angle X-ray scattering (SAXS): particle/pore size distribution and correlation length analysis, nanoscale structural analysis containing atoms and molecular, structure and dynamics of biological macromolecules, liquids
- Microdiffraction: XRD with the ability to precisely and accurately position a small X-ray beam (down to Ø100 µm size) on a small sample.
Sample Sizes:
- Maximum wafer diameter: 150 mm (6 in).
- Small piece of bulk: Yes
- Small amount of powder: Yes
Instrument Features
- Outfitted with three detectors for maximum versatility and speed: a point scintillator, a 1D D/teX Ultra high-speed silicon strip detector, and a 2D CMOS Pilatus area detector (module size: 83.8 × 33.5 mm²).
- The Anton Paar DHS domed hot stage can be used for in situ measurements of samples in vacuum, air, or inert gas up to 1000°C. A second furnace stage offers in situ XRD capability in vacuum or air up to 1400°C.
- Incident beam monochromators and analyzer monochromators enable medium and high-resolution X-ray diffraction and reflectivity measurements of highly perfect crystals, epilayers, and multilayer samples with up to 5 arc second resolution.
Popular Applications
- Polycrystalline XRD for powder, thin-film, and bulk
- Thin-film XRD including GIXRD, pole figure, inplane XRD
- High-Temperature XRD
- XRR and SAXS
- High-resolution XRD (Rocking curve and RSM measurement)
Instrument Specifications
| 2.2kW Cu Ka x-ray generator | λ = 1.5405 Å |
| X-ray generator ranges | -20 kV to 40 kV; 2 mA to 44 mA |
| Scintillation point detector | high-speed position sensitive detector system Dtex Ultra, and a 2D CMOS Pilatus area detector (module size: 83.8 × 33.5 mm²) |
| Five-axis high precision goniometer | 100 mm x 100 mm X-Y-Z sample stage, Rx-Ry sample stage |
| Optics | Bragg Brentano parafocusing optics and parallel beam optics with a parabolic X-ray mirror |
| High-temperature measurements | Anton Paar domed hot stage for high-temperature measurements of up to 1000 °C in air, vacuum, or inert gas. |
| Rigaku high-temperature furnace | Up to 1400 °C in air and vacuum |
| Capillary stage | Data collection in transmission mode for polycrystalline or solution materials |
| SAXS measurement attachment | Available |
Useful Information
Instruction & Brochure
Application Notes
SOP & Safety Documents
Standard Operating Procedures